Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines

Title
Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines
Authors
Keywords
-
Journal
Scientific Reports
Volume 11, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2021-03-04
DOI
10.1038/s41598-021-84308-4

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