4.8 Article

Bifunctional Silver-Doped ZnO for Reliable and Stable Organic- Inorganic Hybrid Perovskite Memory

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 13, Issue 1, Pages 1021-1026

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.0c18038

Keywords

halide perovskites; resistive switching memory devices; multilayer structure; passivation; sequential vapor deposition

Funding

  1. National Research Foundation of Korea [NRF-2016M3D1A1027665, 2019R1A2C2084114]
  2. Industrial Strategic Technology Development Program - Ministry of Trade, Industry and Energy (MOTIE, Korea) [20003968]
  3. Brain Korea 21 PLUS project (Center for Creative Industrial Materials)
  4. Korea Evaluation Institute of Industrial Technology (KEIT) [20003968] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
  5. National Research Foundation of Korea [2019R1A2C2084114] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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This study presents nanoscale HP-based memory devices with a Ag-doped ZnO (AZO) layer, which can improve reliability by controlling filament formation. The device shows excellent endurance and stability, with a high on/off ratio, making it suitable for high-density applications.
Halide perovskites (HPs) have possible uses as an active layer for emerging memory devices due to their low operation voltage and high on/off ratio. However, HP-based memory devices, which are operated by the formation of a conductive filament, still suffer from reliability issues such as limited endurance and stability. To solve the problems, it is essential to control filament formation in the active layer. Here, we present nanoscale HP-based memory devices that have a Ag-doped ZnO (AZO) layer on HP. The AZO layer is used as a Ag ion reservoir for filament formation in HP, and this reservoir enables control of filament formation. By adjusting the Ag concentration in the AZO layer, the controlled filament composed of Ag can be formed; as a result, the memory device has excellent endurance (3 x 10(4) cycles) compared to the device that uses a Ag electrode instead of an AZO layer (4 x 10(2) cycles). Also, an AZO layer can passivate HP, so the device operates stably in ambient air for 15 days with a high on/off ratio (10(6)). These results demonstrate that the introduction of the AZO layer can improve the reliability of HP-based memory devices for high-density applications.

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