A Reliable Ultrafast Short-Circuit Protection Method for E-Mode GaN HEMT

Published 2020 View Full Article

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Title
A Reliable Ultrafast Short-Circuit Protection Method for E-Mode GaN HEMT
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON POWER ELECTRONICS
Volume 35, Issue 9, Pages 8926-8933
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2020-01-24
DOI
10.1109/tpel.2020.2968865

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