A Reliable Ultrafast Short-Circuit Protection Method for E-Mode GaN HEMT

标题
A Reliable Ultrafast Short-Circuit Protection Method for E-Mode GaN HEMT
作者
关键词
-
出版物
IEEE TRANSACTIONS ON POWER ELECTRONICS
Volume 35, Issue 9, Pages 8926-8933
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2020-01-24
DOI
10.1109/tpel.2020.2968865

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