Inspection and Classification of Semiconductor Wafer Surface Defects Using CNN Deep Learning Networks

A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing

(2019) Muhammad Saqlain et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING

Object Detection With Deep Learning: A Review

(2019) Zhong-Qiu Zhao et al.   IEEE Transactions on Neural Networks and Learning Systems

A Mathematical Theory of Deep Convolutional Neural Networks for Feature Extraction

(2018) Thomas Wiatowski et al.   IEEE TRANSACTIONS ON INFORMATION THEORY

Wafer yield prediction using derived spatial variables

(2017) Hang Dong et al.   QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL

Testing Open Defects in Memristor-Based Memories

(2015) Said Hamdioui et al.   IEEE TRANSACTIONS ON COMPUTERS

Vision meets robotics: The KITTI dataset

(2013) A Geiger et al.   INTERNATIONAL JOURNAL OF ROBOTICS RESEARCH

Wafer Classification Using Support Vector Machines

(2012) R. Baly et al.   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING