Testing Open Defects in Memristor-Based Memories

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Title
Testing Open Defects in Memristor-Based Memories
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON COMPUTERS
Volume 64, Issue 1, Pages 247-259
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-10-19
DOI
10.1109/tc.2013.206

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