X-Ray Topography-More than Nice Pictures

Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample

(2020) Felix Hofmann et al.   Physical Review Materials

Mapping of individual dislocations with dark-field X-ray microscopy

(2019) A. C. Jakobsen et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Full-field structured-illumination super-resolution X-ray transmission microscopy

(2019) Benedikt Günther et al.   Nature Communications

Analysis of the Basal Plane Dislocation Density and Thermomechanical Stress during 100 mm PVT Growth of 4H-SiC

(2019) Johannes Steiner et al.   Materials

In-Operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices

(2019) B.K. Tanner et al.   MICROELECTRONICS RELIABILITY

Simultaneous X-ray radiography and diffraction topography imaging applied to silicon for defect analysis during melting and crystallization

(2019) Maike Becker et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

On the importance of dislocation flow in continuum plasticity models for semiconductor materials

(2019) Binh Duong Nguyen et al.   JOURNAL OF CRYSTAL GROWTH

Ultra high-speed x-ray imaging of laser-driven shock compression using synchrotron light

(2018) Margie P Olbinado et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

X-ray topo-tomography studies of linear dislocations in silicon single crystals

(2018) Victor Asadchikov et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Investigation of dislocation cluster evolution during directional solidification of multicrystalline silicon

(2017) Daniel Oriwol et al.   JOURNAL OF CRYSTAL GROWTH

Crystalline damage in silicon wafers and 'rare event' failure introduced by low-energy mechanical impact

(2017) F. Atrash et al.   MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

X-ray ptychography

(2017) Franz Pfeiffer   Nature Photonics

Correlated Three-Dimensional Imaging of Dislocations: Insights into the Onset of Thermal Slip in Semiconductor Wafers

(2017) D. Hänschke et al.   PHYSICAL REVIEW LETTERS

X-ray diffraction microscopy based on refractive optics

(2017) H. F. Poulsen et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages

(2017) B. K. Tanner et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Dynamic deformation and fracture of single crystal silicon: Fracture modes, damage laws, and anisotropy

(2016) J.Y. Huang et al.   ACTA MATERIALIA

Dislocation patterning and bunching in crystals and epitaxial layers - a review

(2016) Peter Rudolph   CRYSTAL RESEARCH AND TECHNOLOGY

B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages

(2016) A. Cowley et al.   MICROELECTRONICS RELIABILITY

Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage

(2016) Alexander Rack et al.   IUCrJ

Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging

(2015) Z. J. Li et al.   JOURNAL OF SYNCHROTRON RADIATION

Large- and small-angle grain boundaries in multi-crystalline silicon and implications for the evolution of grain boundaries during crystal growth

(2014) Eva-Regine Carl et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Exploiting coherence for real-time studies by single-bunch imaging

(2014) A. Rack et al.   JOURNAL OF SYNCHROTRON RADIATION

Small-angle subgrain boundaries emanating from dislocation pile-ups in multicrystalline silicon studied with synchrotron white-beam X-ray topography

(2013) D. Oriwol et al.   ACTA MATERIALIA

Synchrotron X-ray imaging for crystal growth studies

(2013) José Baruchel et al.   COMPTES RENDUS PHYSIQUE

Crack propagation and fracture in silicon wafers under thermal stress

(2013) Andreas Danilewsky et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Experimental verification of the model by Klapper for 4H-SiC homoepitaxy on vicinal substrates

(2013) Birgit Kallinger et al.   JOURNAL OF APPLIED PHYSICS

Non-destructive laboratory-based X-ray diffraction mapping of warpage in Si die embedded in IC packages

(2013) C.S. Wong et al.   MICROELECTRONIC ENGINEERING

X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers

(2013) B.K. Tanner et al.   POWDER DIFFRACTION

Three-dimensional imaging of dislocations by X-ray diffraction laminography

(2012) D. Hänschke et al.   APPLIED PHYSICS LETTERS

Prediction of the propagation probability of individual cracks in brittle single crystal materials

(2012) B. K. Tanner et al.   APPLIED PHYSICS LETTERS

Gas gun shock experiments with single-pulse x-ray phase contrast imaging and diffraction at the Advanced Photon Source

(2012) S. N. Luo et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Thermal slip sources at the extremity and bevel edge of silicon wafers

(2011) B. K. Tanner et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Three-dimensional X-ray diffraction imaging of process-induced dislocation loops in silicon

(2011) David Allen et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments

(2011) A. N. Danilewsky et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

On the implementation of computed laminography using synchrotron radiation

(2011) L. Helfen et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Dislocation sources and slip band nucleation from indents on silicon wafers

(2010) J. Wittge et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

LauePt, a graphical-user-interface program for simulating and analyzing white-beam X-ray diffraction Laue patterns

(2010) X. R. Huang   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Threading dislocations in n- and p-type 4H–SiC material analyzed by etching and synchrotron X-ray topography

(2010) B. Kallinger et al.   JOURNAL OF CRYSTAL GROWTH

Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

(2010) A.N. Danilewsky et al.   JOURNAL OF CRYSTAL GROWTH

X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers

(2010) J. Wittge et al.   POWDER DIFFRACTION

The micro-imaging station of the TopoTomo beamline at the ANKA synchrotron light source

(2009) A. Rack et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography

(2009) A. Danilewsky et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

In-Situ and Real-Time Analysis of the Formation of Strains and Microstructure Defects during Solidification of Al-3.5 Wt Pct Ni Alloys

(2008) G. Reinhart et al.   METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE