Mapping of individual dislocations with dark-field X-ray microscopy
Published 2019 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Mapping of individual dislocations with dark-field X-ray microscopy
Authors
Keywords
-
Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 52, Issue 1, Pages 122-132
Publisher
International Union of Crystallography (IUCr)
Online
2019-02-01
DOI
10.1107/s1600576718017302
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Long-range symmetry breaking in embedded ferroelectrics
- (2018) Hugh Simons et al. NATURE MATERIALS
- Reciprocal space mapping and strain scanning using X-ray diffraction microscopy
- (2018) H. F. Poulsen et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Three-dimensional imaging of dislocation dynamics during the hydriding phase transformation
- (2017) A. Ulvestad et al. NATURE MATERIALS
- X-ray diffraction microscopy based on refractive optics
- (2017) H. F. Poulsen et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Simulating and optimizing compound refractive lens-based X-ray microscopes
- (2017) Hugh Simons et al. JOURNAL OF SYNCHROTRON RADIATION
- Dark-field X-ray microscopy for multiscale structural characterization
- (2015) H. Simons et al. Nature Communications
- High numerical aperture multilayer Laue lenses
- (2015) Andrew J. Morgan et al. Scientific Reports
- Diffraction-limited storage rings – a window to the science of tomorrow
- (2014) Mikael Eriksson et al. JOURNAL OF SYNCHROTRON RADIATION
- Electron tomography of dislocation structures
- (2013) G.S. Liu et al. MATERIALS CHARACTERIZATION
- X-ray micro-beam characterization of lattice rotations and distortions due to an individual dislocation
- (2013) Felix Hofmann et al. Nature Communications
- Observation of recovery and recrystallization in high-purity aluminum measured with forward modeling analysis of high-energy diffraction microscopy
- (2012) Christopher M. Hefferan et al. ACTA MATERIALIA
- Three-dimensional imaging of dislocations by X-ray diffraction laminography
- (2012) D. Hänschke et al. APPLIED PHYSICS LETTERS
- An introduction to three-dimensional X-ray diffraction microscopy
- (2012) Henning Friis Poulsen JOURNAL OF APPLIED CRYSTALLOGRAPHY
- A versatile indirect detector design for hard X-ray microimaging
- (2012) P -A Douissard et al. Journal of Instrumentation
- X-ray transfocators: focusing devices based on compound refractive lenses
- (2010) Gavin B. M. Vaughan et al. JOURNAL OF SYNCHROTRON RADIATION
- HPHT growth and x-ray characterization of high-quality type IIa diamond
- (2009) R C Burns et al. JOURNAL OF PHYSICS-CONDENSED MATTER
- Measurement of strain fields in an edge dislocation
- (2009) Z.S. Dong et al. PHYSICA B-CONDENSED MATTER
- Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis
- (2009) W. Ludwig et al. REVIEW OF SCIENTIFIC INSTRUMENTS
- Observations of Intergranular Stress Corrosion Cracking in a Grain-Mapped Polycrystal
- (2008) A. King et al. SCIENCE
Find Funding. Review Successful Grants.
Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.
ExplorePublish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn More