Local Structure Analysis on Si-Containing DLC Films Based on the Measurement of C K-Edge and Si K-Edge X-ray Absorption Spectra

Title
Local Structure Analysis on Si-Containing DLC Films Based on the Measurement of C K-Edge and Si K-Edge X-ray Absorption Spectra
Authors
Keywords
-
Journal
Coatings
Volume 10, Issue 4, Pages 330
Publisher
MDPI AG
Online
2020-04-01
DOI
10.3390/coatings10040330

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