Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition

Title
Temperature-dependent infrared ellipsometry of Mo-doped VO2 thin films across the insulator to metal transition
Authors
Keywords
-
Journal
Scientific Reports
Volume 10, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2020-05-22
DOI
10.1038/s41598-020-65279-4

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