Phase transition analysis of thermochromic VO 2 thin films by temperature-dependent Raman scattering and ellipsometry

Published 2018 View Full Article

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Title
Phase transition analysis of thermochromic VO 2 thin films by temperature-dependent Raman scattering and ellipsometry
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 456, Issue -, Pages 545-551
Publisher
Elsevier BV
Online
2018-06-19
DOI
10.1016/j.apsusc.2018.06.125

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