A self‐consistent multiple‐peak structure of the photoemission spectra of metallic Fe 2 p as a function of film thickness

Detailed peak fitting analysis of the Zn 2p photoemission spectrum for metallic films and its initial oxidation stages

(2017) D. Cabrera-German et al.   SURFACE AND INTERFACE ANALYSIS

Intensity modulation of the Shirley background of the Cr 3p spectra with photon energies around the Cr 2p edge

(2017) Alberto Herrera-Gomez et al.   SURFACE AND INTERFACE ANALYSIS

Composition assessment of ferric oxide by accurate peak fitting of the Fe 2pphotoemission spectrum

(2016) M. Bravo Sanchez et al.   SURFACE AND INTERFACE ANALYSIS

Accurate peak fitting and subsequent quantitative composition analysis of the spectrum of Co 2pobtained with Al Kα radiation: I: cobalt spinel

(2016) Dagoberto Cabrera-German et al.   SURFACE AND INTERFACE ANALYSIS

Tuning the composition and magnetostructure of dysprosium iron garnets by Co-substitution: An XRD, FT-IR, XPS and VSM study

(2015) R. Tholkappiyan et al.   APPLIED SURFACE SCIENCE

Practical methods for background subtraction in photoemission spectra

(2014) A. Herrera-Gomez et al.   SURFACE AND INTERFACE ANALYSIS

The slope-background for the near-peak regimen of photoemission spectra

(2013) A. Herrera-Gomez et al.   JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Instrument-related geometrical factors affecting the intensity in XPS and ARXPS experiments

(2011) A. Herrera-Gomez et al.   JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Resolving overlapping peaks in ARXPS data: The effect of noise and fitting method

(2011) Jaime Muñoz-Flores et al.   JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Effect of monochromator X-ray Bragg reflection on photoelectric cross section

(2010) A. Herrera-Gomez   JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Thermal stability of lanthanum in hafnium-based gate stacks

(2009) M. I. Medina-Montes et al.   JOURNAL OF APPLIED PHYSICS

Thermal stability of nitrogen in nitrided HfSiO2/SiO2/Si(001) ultrathin films

(2008) A. Herrera-Gomez et al.   JOURNAL OF APPLIED PHYSICS