Resolving overlapping peaks in ARXPS data: The effect of noise and fitting method

Published 2011 View Full Article

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Title
Resolving overlapping peaks in ARXPS data: The effect of noise and fitting method
Authors
Keywords
-
Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 184, Issue 11-12, Pages 533-541
Publisher
Elsevier BV
Online
2011-09-11
DOI
10.1016/j.elspec.2011.08.004

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