Forming-Free, Fast, Uniform, and High Endurance Resistive Switching From Cryogenic to High Temperatures in W/AlOx/Al2O3/Pt Bilayer Memristor

Published 2020 View Full Article

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Title
Forming-Free, Fast, Uniform, and High Endurance Resistive Switching From Cryogenic to High Temperatures in W/AlOx/Al2O3/Pt Bilayer Memristor
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 41, Issue 4, Pages 549-552
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2020-03-03
DOI
10.1109/led.2020.2977397

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