The effects of thin film homogeneity on the performance of ferroelectric tunnel junctions

Tunneling current in HfO2 and Hf0.5Zr0.5O2-based ferroelectric tunnel junction

(2018) Zhipeng Dong et al.   JOURNAL OF APPLIED PHYSICS

Ultra-low power Hf0.5Zr0.5O2 based ferroelectric tunnel junction synapses for hardware neural network applications

(2018) Lin Chen et al.   Nanoscale

Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits

(2018) Xunzhao Yin et al.   IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS

A rhombohedral ferroelectric phase in epitaxially strained Hf0.5Zr0.5O2 thin films

(2018) Yingfen Wei et al.   NATURE MATERIALS

Modeling ferroelectric film properties and size effects from tetragonal interlayer in Hf1–xZrxO2 grains

(2017) Christopher Künneth et al.   JOURNAL OF APPLIED PHYSICS

Kinetic pathway of the ferroelectric phase formation in doped HfO2 films

(2017) Lun Xu et al.   JOURNAL OF APPLIED PHYSICS

Julia: A Fresh Approach to Numerical Computing

(2017) Jeff Bezanson et al.   SIAM REVIEW

Impact of mechanical stress on ferroelectricity in (Hf0.5Zr0.5)O2 thin films

(2016) Takahisa Shiraishi et al.   APPLIED PHYSICS LETTERS

Ferroelectricity in undoped hafnium oxide

(2015) Patrick Polakowski et al.   APPLIED PHYSICS LETTERS

Characterization of the insulator barrier and the superconducting transition temperature in GdBa2Cu3O7−δ/BaTiO3 bilayers for application in tunnel junctions

(2015) H. Navarro et al.   JOURNAL OF APPLIED PHYSICS

The effects of crystallographic orientation and strain of thin Hf0.5Zr0.5O2 film on its ferroelectricity

(2014) Min Hyuk Park et al.   APPLIED PHYSICS LETTERS

Grain size engineering for ferroelectric Hf0.5Zr0.5O2 films by an insertion of Al2O3 interlayer

(2014) Han Joon Kim et al.   APPLIED PHYSICS LETTERS

Giant electrode effect on tunnelling electroresistance in ferroelectric tunnel junctions

(2014) Rohit Soni et al.   Nature Communications

Ferroelectric tunnel junctions for information storage and processing

(2014) Vincent Garcia et al.   Nature Communications

Ferroelectricity in hafnium oxide thin films

(2011) T. S. Böscke et al.   APPLIED PHYSICS LETTERS

Ultimate scaling of TiN/ZrO2/TiN capacitors: Leakage currents and limitations due to electrode roughness

(2011) Gunther Jegert et al.   JOURNAL OF APPLIED PHYSICS

Electroresistance effects in ferroelectric tunnel barriers

(2010) D. Pantel et al.   PHYSICAL REVIEW B

Characteristics and Reliability of Hafnium Oxide Dielectric Stacks With Room Temperature Grown Interfacial Anodic Oxide

(2009) C.-H. Chang et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Tunneling Electroresistance Effect in Ferroelectric Tunnel Junctions at the Nanoscale

(2009) A. Gruverman et al.   NANO LETTERS