Solution-Processed Organic Transistors with Excellent Electrical Stability under Ambient Conditions

Complete suppression of bias-induced threshold voltage shift below 273K in solution-processed high-performance organic transistors

(2018) Michel Kettner et al.   ACS Applied Materials & Interfaces

High-Mobility, Ultrathin Organic Semiconducting Films Realized by Surface-Mediated Crystallization

(2017) I. Vladimirov et al.   NANO LETTERS

Critical assessment of charge mobility extraction in FETs

(2017) Hyun Ho Choi et al.   NATURE MATERIALS

High operational and environmental stability of high-mobility conjugated polymer field-effect transistors through the use of molecular additives

(2016) Mark Nikolka et al.   NATURE MATERIALS

Identification of grain boundaries as degradation site in n-channel organic field-effect transistors determined via conductive atomic force microscopy

(2016) Sebastian Müller et al.   Physica Status Solidi-Rapid Research Letters

Mobility overestimation due to gated contacts in organic field-effect transistors

(2016) Emily G. Bittle et al.   Nature Communications

Separating the impact of oxygen and water on the long-term stability of n-channel perylene diimide thin-film transistors

(2015) Ute Zschieschang et al.   ORGANIC ELECTRONICS

Realization of electrically stable organic field-effect transistors using simple polymer blended dielectrics

(2015) Kyunghun Kim et al.   ORGANIC ELECTRONICS

A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements

(2015) Sibani Bisoyi et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

The Origin of Excellent Gate-Bias Stress Stability in Organic Field-Effect Transistors Employing Fluorinated-Polymer Gate Dielectrics

(2014) Jiye Kim et al.   ADVANCED MATERIALS

25th Anniversary Article: Organic Field-Effect Transistors: The Path Beyond Amorphous Silicon

(2014) Henning Sirringhaus   ADVANCED MATERIALS

25th Anniversary Article: Microstructure Dependent Bias Stability of Organic Transistors

(2014) Wi Hyoung Lee et al.   ADVANCED MATERIALS

Analyzing the influence of negative gate bias stress on the transconductance of solution-processed, organic thin-film transistors

(2014) J. Sprogies et al.   JOURNAL OF APPLIED PHYSICS

Fully Solution-Processed Flexible Organic Thin Film Transistor Arrays with High Mobility and Exceptional Uniformity

(2014) Kenjiro Fukuda et al.   Scientific Reports

Reliable and Uniform Thin-Film Transistor Arrays Based on Inkjet-Printed Polymer Semiconductors for Full Color Reflective Displays

(2013) Jiyoul Lee et al.   ADVANCED MATERIALS

Operational Stability of Organic Field-Effect Transistors

(2012) Peter A. Bobbert et al.   ADVANCED MATERIALS

Tailored interfaces for self-patterning organic thin-film transistors

(2012) Jeremy W. Ward et al.   JOURNAL OF MATERIALS CHEMISTRY

Spectroscopic Investigation of Oxygen- and Water-Induced Electron Trapping and Charge Transport Instabilities in n-type Polymer Semiconductors

(2012) Riccardo Di Pietro et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Low-Temperature Processed Flexible In–Ga–Zn–O Thin-Film Transistors Exhibiting High Electrical Performance

(2011) Shinhyuk Yang et al.   IEEE ELECTRON DEVICE LETTERS

Inkjet printing of single-crystal films

(2011) Hiromi Minemawari et al.   NATURE

Reliability of Organic Field-Effect Transistors

(2009) Henning Sirringhaus   ADVANCED MATERIALS

Tradeoff regimes of lifetime in amorphous silicon thin-film transistors and a universal lifetime comparison framework

(2009) Bahman Hekmatshoar et al.   APPLIED PHYSICS LETTERS

Proton migration mechanism for the instability of organic field-effect transistors

(2009) A. Sharma et al.   APPLIED PHYSICS LETTERS

The Importance of Grain Boundaries for the Time-Dependent Mobility Degradation in Organic Thin-Film Transistors

(2009) R. T. Weitz et al.   CHEMISTRY OF MATERIALS

Highly Reliable Carbon Nanotube Transistors with Patterned Gates and Molecular Gate Dielectric

(2009) R. Thomas Weitz et al.   NANO LETTERS

Bias stress effect in low-voltage organic thin-film transistors

(2008) Ute Zschieschang et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING