A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements

Title
A comprehensive study of charge trapping in organic field-effect devices with promising semiconductors and different contact metals by displacement current measurements
Authors
Keywords
-
Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 31, Issue 2, Pages 025011
Publisher
IOP Publishing
Online
2015-12-21
DOI
10.1088/0268-1242/31/2/025011

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now