Development and characterization of monolithic multilayer Laue lens nanofocusing optics
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Title
Development and characterization of monolithic multilayer Laue lens nanofocusing optics
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 108, Issue 26, Pages 261102
Publisher
AIP Publishing
Online
2016-06-28
DOI
10.1063/1.4955022
References
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Related references
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- X-ray ptychographic computed tomography at 16 nm isotropic 3D resolution
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- Ptychography with multilayer Laue lenses
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- Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope
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- Optimization of multilayer Laue lenses for a scanning X-ray microscope
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- Sub-10 nm beam confinement by X-ray waveguides: design, fabrication and characterization of optical properties
- (2012) S. P. Krüger et al. JOURNAL OF SYNCHROTRON RADIATION
- Real space soft x-ray imaging at 10 nm spatial resolution
- (2012) W. Chao et al. OPTICS EXPRESS
- The Race to X-ray Microbeam and Nanobeam Science
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- Hard x-ray nanobeam characterization by coherent diffraction microscopy
- (2010) A. Schropp et al. APPLIED PHYSICS LETTERS
- Ultra-high resolution zone-doubled diffractive X-ray optics for the multi-keV regime
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- Breaking the 10 nm barrier in hard-X-ray focusing
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- Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens
- (2008) Hyon Chol Kang et al. APPLIED PHYSICS LETTERS
- High-Resolution Scanning X-ray Diffraction Microscopy
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