Pushing the limits: an instrument for hard X-ray imaging below 20 nm

Hard x-ray nanofocusing by multilayer Laue lenses

(2014) Hanfei Yan et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Optimization of overlap uniformness for ptychography

(2014) Xiaojing Huang et al.   OPTICS EXPRESS

Design and performance of a scanning ptychography microscope

(2014) E. Nazaretski et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope

(2013) E. Nazaretski et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Nanoresolution radiology of neurons

(2012) H R Wu et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Transmission and emission x-ray microscopy: operation modes, contrast mechanisms and applications

(2011) Burkhard Kaulich et al.   JOURNAL OF PHYSICS-CONDENSED MATTER

Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses

(2011) Hanfei Yan et al.   OPTICS EXPRESS

Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm

(2011) Tsung-Yu Chen et al.   OPTICS EXPRESS

Topological Defects Coupling Smectic Modulations to Intra-Unit-Cell Nematicity in Cuprates

(2011) A. Mesaros et al.   SCIENCE

The Race to X-ray Microbeam and Nanobeam Science

(2011) G. E. Ice et al.   SCIENCE

Unambiguous Determination of the Adsorption Geometry of a Metal−Organic Complex on a Bulk Insulator

(2010) Knud Lämmle et al.   NANO LETTERS

Ultra-high resolution zone-doubled 
diffractive X-ray optics for the multi-keV regime

(2010) Joan Vila-Comamala et al.   OPTICS EXPRESS

Breaking the 10 nm barrier in hard-X-ray focusing

(2009) Hidekazu Mimura et al.   Nature Physics

A low-temperature spin-polarized scanning tunneling microscope operating in a fully rotatable magnetic field

(2009) S. Meckler et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Design of a variable temperature scanning force microscope

(2009) E. Nazaretski et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Efficient subpixel image registration algorithms

(2008) Manuel Guizar-Sicairos et al.   OPTICS LETTERS

High-Resolution Scanning X-ray Diffraction Microscopy

(2008) P. Thibault et al.   SCIENCE