Two-dimensional percolation threshold in confined Si nanoparticle networks

Electronic properties of phosphorus doped silicon nanocrystals embedded in SiO2

(2015) Sebastian Gutsch et al.   APPLIED PHYSICS LETTERS

Charge transport in silicon nanocrystal superlattices in the terahertz regime

(2015) H. Němec et al.   PHYSICAL REVIEW B

Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes

(2015) Sebastian Gutsch et al.   Beilstein Journal of Nanotechnology

Effects of inter-nanocrystal distance on luminescence quantum yield in ensembles of Si nanocrystals

(2014) J. Valenta et al.   APPLIED PHYSICS LETTERS

Formation of size controlled silicon nanocrystals in nitrogen free silicon dioxide matrix prepared by plasma enhanced chemical vapor deposition

(2014) J. Laube et al.   JOURNAL OF APPLIED PHYSICS

Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering

(2014) S. Hernández et al.   JOURNAL OF APPLIED PHYSICS

Formation and coarsening of sponge-like Si-SiO2 nanocomposites

(2013) B. Liedke et al.   APPLIED PHYSICS LETTERS

Sponge-like Si-SiO2 nanocomposite—Morphology studies of spinodally decomposed silicon-rich oxide

(2013) D. Friedrich et al.   APPLIED PHYSICS LETTERS

Charge transport in Si nanocrystal/SiO2 superlattices

(2013) S. Gutsch et al.   JOURNAL OF APPLIED PHYSICS

Charge transport and electroluminescence of silicon nanocrystals/SiO2 superlattices

(2013) J. López-Vidrier et al.   JOURNAL OF APPLIED PHYSICS

Looking Inside a Working SiLED

(2013) Florian Maier-Flaig et al.   NANO LETTERS

Electrical transport mechanisms in three dimensional ensembles of silicon quantum dots

(2011) I. Balberg   JOURNAL OF APPLIED PHYSICS

Percolation of diffusionally evolved two-phase systems

(2011) Victor E. Brunini et al.   PHYSICAL REVIEW E

High power efficiency in Si-nc/SiO2 multilayer light emitting devices by bipolar direct tunneling

(2009) A. Marconi et al.   APPLIED PHYSICS LETTERS

Imaging Si nanoparticles embedded in SiO2 layers by (S)TEM-EELS

(2007) S. Schamm et al.   ULTRAMICROSCOPY