Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes

Published 2015 View Full Article

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Title
Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes
Authors
Keywords
-
Journal
Beilstein Journal of Nanotechnology
Volume 6, Issue -, Pages 964-970
Publisher
Beilstein Institut
Online
2015-04-15
DOI
10.3762/bjnano.6.99

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