Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering

Title
Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 115, Issue 20, Pages 203504
Publisher
AIP Publishing
Online
2014-05-24
DOI
10.1063/1.4878175

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