Strain measurement in ferromagnetic crystals using dark-field electron holography

Differential phase-contrast dark-field electron holography for strain mapping

(2016) Thibaud Denneulin et al.   ULTRAMICROSCOPY

Realization of a tilted reference wave for electron holography by means of a condenser biprism

(2016) Falk Röder et al.   ULTRAMICROSCOPY

Strain measurements from Nd2Fe14B grains in sintered magnets using artificial moiré fringes

(2015) Y. Murakami et al.   ACTA MATERIALIA

Magnetism of ultrathin intergranular boundary regions in Nd–Fe–B permanent magnets

(2014) Y. Murakami et al.   ACTA MATERIALIA

Effects of deformation on the crystal field parameter of the Nd ions in Nd2Fe14B

(2014) Tsuneaki Suzuki et al.   JOURNAL OF APPLIED PHYSICS

Dynamical effects in strain measurements by dark-field electron holography

(2014) E. Javon et al.   ULTRAMICROSCOPY

Scanning moiré fringe imaging for quantitative strain mapping in semiconductor devices

(2013) Suhyun Kim et al.   APPLIED PHYSICS LETTERS

Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography

(2013) A. Béché et al.   ULTRAMICROSCOPY

Correlative multi-scale characterization of a fine grained Nd–Fe–B sintered magnet

(2013) T.T. Sasaki et al.   ULTRAMICROSCOPY

Dynamic scattering theory for dark-field electron holography of 3D strain fields

(2013) Axel Lubk et al.   ULTRAMICROSCOPY

Study of coherence strain of GP II zones in an aged aluminum composite

(2012) J.L. Hernández-Rivera et al.   JOURNAL OF ALLOYS AND COMPOUNDS

Strategy for high-coercivity Nd–Fe–B magnets

(2012) K. Hono et al.   SCRIPTA MATERIALIA

Strain mapping of LED devices by dark-field inline electron holography: Comparison between deterministic and iterative phase retrieval approaches

(2012) Kyung Song et al.   ULTRAMICROSCOPY

Dark-field electron holography for the measurement of geometric phase

(2011) M.J. Hÿtch et al.   ULTRAMICROSCOPY

An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices

(2010) Christoph T. Koch et al.   APPLIED PHYSICS LETTERS

The role of local anisotropy profiles at grain boundaries on the coercivity of Nd2Fe14B magnets

(2010) Gino Hrkac et al.   APPLIED PHYSICS LETTERS

Strain mapping for the semiconductor industry by dark-field electron holography and nanobeam electron diffraction with nm resolution

(2010) David Cooper et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Dark field electron holography for strain measurement

(2010) A. Béché et al.   ULTRAMICROSCOPY

Improved precision in strain measurement using nanobeam electron diffraction

(2009) A. Béché et al.   APPLIED PHYSICS LETTERS

Nanoscale holographic interferometry for strain measurements in electronic devices

(2008) Martin Hÿtch et al.   NATURE