A Robust Patterning Technique for Electron Microscopy-Based Digital Image Correlation at Sub-Micron Resolutions
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Title
A Robust Patterning Technique for Electron Microscopy-Based Digital Image Correlation at Sub-Micron Resolutions
Authors
Keywords
Digital image correlation, Scanning electron microscopy, Speckle pattern, Reconfiguration, Composites
Journal
EXPERIMENTAL MECHANICS
Volume -, Issue -, Pages -
Publisher
Springer Nature
Online
2019-03-12
DOI
10.1007/s11340-019-00487-2
References
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