Impact of barrier layer on HfO2-based conductive bridge random access memory

Resistive Switching Characteristics and Reliability of SiNx-Based Conductive Bridge Random Access Memory

(2018) Chun-An Lin et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Enhanced Properties in Conductive-Bridge Resistive Switching Memory With Oxide-Nitride Bilayer Structure

(2016) Tsung-Ling Tsai et al.   IEEE ELECTRON DEVICE LETTERS

Role of Local Chemical Potential of Cu on Data Retention Properties of Cu-Based Conductive-Bridge RAM

(2016) Jiyong Woo et al.   IEEE ELECTRON DEVICE LETTERS

Carrier mobility extraction method in ChGs in the UV light exposure

(2016) Mehdi Saremi   Micro & Nano Letters

A physical-based simulation for the dynamic behavior of photodoping mechanism in chalcogenide materials used in the lateral programmable metallization cells

(2016) Mehdi Saremi   SOLID STATE IONICS

Enhanced switching uniformity in AZO/ZnO1−x/ITO transparent resistive memory devices by bipolar double forming

(2015) Firman Mangasa Simanjuntak et al.   APPLIED PHYSICS LETTERS

Impact of Post-Oxide Deposition Annealing on Resistive Switching in HfO2-Based Oxide RRAM and Conductive-Bridge RAM Devices

(2015) Tsung-Ling Tsai et al.   IEEE ELECTRON DEVICE LETTERS

The role of oxygen plasma in the formation of oxygen defects in HfOx films deposited at room temperature

(2015) Mochamad Januar et al.   Journal of Materials Chemistry C

Electrochemical dynamics of nanoscale metallic inclusions in dielectrics

(2014) Yuchao Yang et al.   Nature Communications

Cycle-to-Cycle Intrinsic RESET Statistics in ${\rm HfO}_{2}$-Based Unipolar RRAM Devices

(2013) Shibing Long et al.   IEEE ELECTRON DEVICE LETTERS

Memristive devices for computing

(2012) J. Joshua Yang et al.   Nature Nanotechnology

Nonvolatile Memory Effect in a Au/Cu–ZnO/p-Si Type of Metal–Insulator–Semiconductor Structure

(2011) T. Ghosh et al.   IEEE ELECTRON DEVICE LETTERS

Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges

(2009) Rainer Waser et al.   ADVANCED MATERIALS

Diffusivity of Cu Ions in Solid Electrolyte and Its Effect on the Performance of Nanometer-Scale Switch

(2008) Naoki Banno et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES