Enhanced Interfacial Adhesion and Thermal Stability in Bismuth Telluride/Nickel/Copper Multilayer Films with Low Electrical Contact Resistance
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Title
Enhanced Interfacial Adhesion and Thermal Stability in Bismuth Telluride/Nickel/Copper Multilayer Films with Low Electrical Contact Resistance
Authors
Keywords
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Journal
Advanced Materials Interfaces
Volume 5, Issue 23, Pages 1801279
Publisher
Wiley
Online
2018-10-11
DOI
10.1002/admi.201801279
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