Potential of ITO thin film for electrical probe memory applications
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Title
Potential of ITO thin film for electrical probe memory applications
Authors
Keywords
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Journal
SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS
Volume 19, Issue 1, Pages 791-801
Publisher
Informa UK Limited
Online
2018-10-29
DOI
10.1080/14686996.2018.1534072
References
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- The Design of Rewritable Ultrahigh Density Scanning-Probe Phase-Change Memories
- (2010) C. David. Wright et al. IEEE TRANSACTIONS ON NANOTECHNOLOGY
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- Thermal stability of indium tin oxide thin films co-sputtered with zinc oxide
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