Encapsulated tips for reliable nanoscale conduction in scanning probe technologies

Published 2009 View Full Article

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Title
Encapsulated tips for reliable nanoscale conduction in scanning probe technologies
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 20, Issue 10, Pages 105701
Publisher
IOP Publishing
Online
2009-02-18
DOI
10.1088/0957-4484/20/10/105701

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