Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations

Title
Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations
Authors
Keywords
-
Journal
JOURNAL OF MATERIALS RESEARCH
Volume 33, Issue 23, Pages 4018-4030
Publisher
Cambridge University Press (CUP)
Online
2018-11-06
DOI
10.1557/jmr.2018.375

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