Imaging of radiation damage using complementary field ion microscopy and atom probe tomography

Published 2015 View Full Article

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Title
Imaging of radiation damage using complementary field ion microscopy and atom probe tomography
Authors
Keywords
Field ion microscopy, Atom probe tomography, Radiation damage, Crystal defects, Tungsten, Tungsten–tantalum alloy
Journal
ULTRAMICROSCOPY
Volume 159, Issue -, Pages 387-394
Publisher
Elsevier BV
Online
2015-03-03
DOI
10.1016/j.ultramic.2015.02.017

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