Depth resolution function of the laser assisted tomographic atom probe in the investigation of semiconductors

Effects of annealing on local composition and electrical transport correlations in MgO-based magnetic tunnel junctions

(2008) A. N. Chiaramonti et al.   APPLIED PHYSICS LETTERS

Atomic scale characterization of buried InxGa1−xAs quantum dots using pulsed laser atom probe tomography

(2008) M. Müller et al.   APPLIED PHYSICS LETTERS

Semiconductor profiling with sub-nm resolution: Challenges and solutions

(2008) W. Vandervorst   APPLIED SURFACE SCIENCE

Laser-assisted atom probe tomography and nanosciences

(2008) Didier Blavette et al.   International Journal of Materials Research

Atom probe tomography of Ni silicides: First stages of reaction and redistribution of Pt

(2008) D. Mangelinck et al.   MICROELECTRONIC ENGINEERING

Estimation of the Reconstruction Parameters for Atom Probe Tomography

(2008) Baptiste Gault et al.   MICROSCOPY AND MICROANALYSIS