Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images
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Title
Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: Effect of the aperture edge on the ion current images
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 124, Issue 17, Pages 174902
Publisher
AIP Publishing
Online
2018-11-02
DOI
10.1063/1.5053879
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