Comparison of Scanning Ion Conductance Microscopy with Atomic Force Microscopy for Cell Imaging

Published 2010 View Full Article

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Title
Comparison of Scanning Ion Conductance Microscopy with Atomic Force Microscopy for Cell Imaging
Authors
Keywords
-
Journal
LANGMUIR
Volume 27, Issue 2, Pages 697-704
Publisher
American Chemical Society (ACS)
Online
2010-12-15
DOI
10.1021/la103275y

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