Ion beam profiling from the interaction with a freestanding 2D layer

Published 2017 View Full Article

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Title
Ion beam profiling from the interaction with a freestanding 2D layer
Authors
Keywords
-
Journal
Beilstein Journal of Nanotechnology
Volume 8, Issue -, Pages 682-687
Publisher
Beilstein Institut
Online
2017-03-23
DOI
10.3762/bjnano.8.73

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