Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy
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Title
Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy
Authors
Keywords
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Journal
APL Materials
Volume 2, Issue 9, Pages 092502
Publisher
AIP Publishing
Online
2014-07-17
DOI
10.1063/1.4889815
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