Direct Measurement of the Thickness-Dependent Electronic Band Structure ofMoS2Using Angle-Resolved Photoemission Spectroscopy
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Title
Direct Measurement of the Thickness-Dependent Electronic Band Structure ofMoS2Using Angle-Resolved Photoemission Spectroscopy
Authors
Keywords
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Journal
PHYSICAL REVIEW LETTERS
Volume 111, Issue 10, Pages -
Publisher
American Physical Society (APS)
Online
2013-09-05
DOI
10.1103/physrevlett.111.106801
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