Qubit Metrology of Ultralow Phase Noise Using Randomized Benchmarking
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Title
Qubit Metrology of Ultralow Phase Noise Using Randomized Benchmarking
Authors
Keywords
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Journal
Physical Review Applied
Volume 3, Issue 4, Pages -
Publisher
American Physical Society (APS)
Online
2015-04-29
DOI
10.1103/physrevapplied.3.044009
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