Efficient Measurement of Quantum Gate Error by Interleaved Randomized Benchmarking

Characterizing quantum gates via randomized benchmarking

(2012) Easwar Magesan et al.   PHYSICAL REVIEW A

Universal Quantum Gate Set Approaching Fault-Tolerant Thresholds with Superconducting Qubits

(2012) Jerry M. Chow et al.   PHYSICAL REVIEW LETTERS

Simplified instantaneous non-local quantum computation with applications to position-based cryptography

(2011) Salman Beigi et al.   NEW JOURNAL OF PHYSICS

Single-qubit-gate error below10−4in a trapped ion

(2011) K. R. Brown et al.   PHYSICAL REVIEW A

Practical Characterization of Quantum Devices without Tomography

(2011) Marcus P. da Silva et al.   PHYSICAL REVIEW LETTERS

Scalable and Robust Randomized Benchmarking of Quantum Processes

(2011) Easwar Magesan et al.   PHYSICAL REVIEW LETTERS

Direct Fidelity Estimation from Few Pauli Measurements

(2011) Steven T. Flammia et al.   PHYSICAL REVIEW LETTERS

Observation of High Coherence in Josephson Junction Qubits Measured in a Three-Dimensional Circuit QED Architecture

(2011) Hanhee Paik et al.   PHYSICAL REVIEW LETTERS

Randomized benchmarking of atomic qubits in an optical lattice

(2010) S Olmschenk et al.   NEW JOURNAL OF PHYSICS

Optimized driving of superconducting artificial atoms for improved single-qubit gates

(2010) J. M. Chow et al.   PHYSICAL REVIEW A

Randomized benchmarking of single- and multi-qubit control in liquid-state NMR quantum information processing

(2009) C A Ryan et al.   NEW JOURNAL OF PHYSICS

Simple Pulses for Elimination of Leakage in Weakly Nonlinear Qubits

(2009) F. Motzoi et al.   PHYSICAL REVIEW LETTERS

Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit

(2009) J. M. Chow et al.   PHYSICAL REVIEW LETTERS

Scalable protocol for identification of correctable codes

(2008) M. Silva et al.   PHYSICAL REVIEW A

Randomized benchmarking of quantum gates

(2008) E. Knill et al.   PHYSICAL REVIEW A

Selective and Efficient Estimation of Parameters for Quantum Process Tomography

(2008) Ariel Bendersky et al.   PHYSICAL REVIEW LETTERS