Quantifying the quantum gate fidelity of single-atom spin qubits in silicon by randomized benchmarking

Title
Quantifying the quantum gate fidelity of single-atom spin qubits in silicon by randomized benchmarking
Authors
Keywords
-
Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 27, Issue 15, Pages 154205
Publisher
IOP Publishing
Online
2015-03-19
DOI
10.1088/0953-8984/27/15/154205

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