Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
出版年份 2014 全文链接
标题
Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
作者
关键词
-
出版物
Scientific Reports
Volume 4, Issue 1, Pages -
出版商
Springer Nature
发表日期
2014-02-26
DOI
10.1038/srep04203
参考文献
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