Analysis of organic multilayers and 3D structures using Ar cluster ions

TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

(2011) Sadia Rabbani et al.   ANALYTICAL CHEMISTRY

Depth profiling by cluster projectiles as seen by computer simulations

(2010) Z. Postawa et al.   SURFACE AND INTERFACE ANALYSIS

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

(2009) Satoshi Ninomiya et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

(2009) Satoshi Ninomiya et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Molecular depth profiling of trehalose using a C60 cluster ion beam

(2008) Andreas Wucher et al.   APPLIED SURFACE SCIENCE

Depth profiling of organic materials using improved ion beam conditions

(2008) H.-G. Cramer et al.   APPLIED SURFACE SCIENCE

Microscopic Insight into the Sputtering of Thin Polystyrene Films on Ag{111} Induced by Large and Slow Ar Clusters

(2007) Lukasz Rzeznik et al.   Journal of Physical Chemistry C