X-ray and synchrotron studies of porous silicon

Published 2013 View Full Article

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Title
X-ray and synchrotron studies of porous silicon
Authors
Keywords
Porous Silicon, Porous Silicon Layer, Porous Silicon Sample, Total External Reflection, Porous Silicon Surface
Journal
SEMICONDUCTORS
Volume 47, Issue 8, Pages 1051-1057
Publisher
Pleiades Publishing Ltd
Online
2013-08-06
DOI
10.1134/s1063782613080174
References
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