X-ray and synchrotron studies of porous silicon

标题
X-ray and synchrotron studies of porous silicon
作者
关键词
Porous Silicon, Porous Silicon Layer, Porous Silicon Sample, Total External Reflection, Porous Silicon Surface
出版物
SEMICONDUCTORS
Volume 47, Issue 8, Pages 1051-1057
出版商
Pleiades Publishing Ltd
发表日期
2013-08-06
DOI
10.1134/s1063782613080174

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