Application of X-ray diffraction methods in the study of micrometer-sized porous Si layers

Title
Application of X-ray diffraction methods in the study of micrometer-sized porous Si layers
Authors
Keywords
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Journal
CRYSTALLOGRAPHY REPORTS
Volume 54, Issue 3, Pages 379-385
Publisher
Pleiades Publishing Ltd
Online
2009-05-16
DOI
10.1134/s1063774509030031

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