Practical aspects of single-pass scan Kelvin probe force microscopy

Electric field concentration in the vicinity of the interface between anode and degraded BaTiO3-based ceramics in multilayer ceramic capacitor

(2011) Takafumi Okamoto et al.   APPLIED PHYSICS LETTERS

Force gradient sensitive detection in lift-mode Kelvin probe force microscopy

(2011) Dominik Ziegler et al.   NANOTECHNOLOGY

Kelvin probe force microscopy in the presence of intrinsic local electric fields

(2011) Christine Baumgart et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

(2010) David J. Ellison et al.   ADVANCED MATERIALS

Photoassisted Kelvin probe force microscopy at GaN surfaces: The role of polarity

(2010) J. D. Wei et al.   APPLIED PHYSICS LETTERS

Investigation of potential and electric field profiles in cross sections of CdTe/CdS solar cells using scanning Kelvin probe microscopy

(2010) H. R. Moutinho et al.   JOURNAL OF APPLIED PHYSICS

Electronic and morphological properties of the electrochemically prepared step bunched silicon (111) surface

(2010) K. Skorupska et al.   PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS

Study of minority carrier diffusion length in multicrystalline silicon solar cells using photoassisted Kelvin probe force microscopy

(2009) Masaki Takihara et al.   APPLIED PHYSICS LETTERS

Measurement of charge distribution in actin bundles by surface potential microscopy

(2009) Peng Zhang et al.   APPLIED PHYSICS LETTERS

Electrical mapping of microtubular structures by surface potential microscopy

(2009) Peng Zhang et al.   APPLIED PHYSICS LETTERS

Topography and surface potential in Kelvin force microscopy of perfluoroalkyl alkanes self-assemblies

(2009) John Alexander et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

Imaging Surface Charges of Individual Biomolecules

(2009) Carl Leung et al.   NANO LETTERS

Quantitative dopant profiling in semiconductors: A Kelvin probe force microscopy model

(2009) C. Baumgart et al.   PHYSICAL REVIEW B

Direct observation of minority carrier leakage in operating laser diodes by Kelvin probe force microscopy

(2009) K. S. Ladutenko et al.   TECHNICAL PHYSICS LETTERS

Probing Local Surface Potential of Quasi-One-Dimensional Systems: A KPFM Study of P3HT Nanofibers

(2008) Andrea Liscio et al.   ADVANCED FUNCTIONAL MATERIALS

Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

(2008) Haichao Huang et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

Observation of individual dopants in a thin silicon layer by low temperature Kelvin Probe Force Microscope

(2008) Maciej Ligowski et al.   APPLIED PHYSICS LETTERS

Control of Length and Spatial Functionality of Single-Wall Carbon Nanotube AFM Nanoprobes

(2008) Haoyan Wei et al.   CHEMISTRY OF MATERIALS

Two-dimensional junction identification in multicrystalline silicon solar cells by scanning Kelvin probe force microscopy

(2008) C.-S. Jiang et al.   JOURNAL OF APPLIED PHYSICS

Ultrasharp and high aspect ratio carbon nanotube atomic force microscopy probes for enhanced surface potential imaging

(2008) Minhua Zhao et al.   NANOTECHNOLOGY

Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

(2008) F. Krok et al.   PHYSICAL REVIEW B