Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions
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Title
Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions
Authors
Keywords
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Journal
PHYSICAL REVIEW B
Volume 87, Issue 11, Pages -
Publisher
American Physical Society (APS)
Online
2013-03-14
DOI
10.1103/physrevb.87.115412
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