Force mapping on a partially H-covered Si(111)-(7×7) surface: Influence of tip and surface reactivity

Quantitative Atomic Resolution Force Imaging on Epitaxial Graphene with Reactive and Nonreactive AFM Probes

(2012) Mark P. Boneschanscher et al.   ACS Nano

Chemical Identification of Single Atoms in Heterogeneous III–IV Chains on Si(100) Surface by Means of nc-AFM and DFT Calculations

(2012) Martin Setvín et al.   ACS Nano

Identifying passivated dynamic force microscopy tips on H:Si(100)

(2012) Peter Sharp et al.   APPLIED PHYSICS LETTERS

Understanding image contrast formation in TiO2with force spectroscopy

(2012) Ayhan Yurtsever et al.   PHYSICAL REVIEW B

Role of orbital overlap in atomic manipulation

(2012) Sam Jarvis et al.   PHYSICAL REVIEW B

Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy

(2012) J. Welker et al.   SCIENCE

‘Sub-atomic’ resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study

(2011) Anna Campbellová et al.   NANOTECHNOLOGY

Forces and Currents in Carbon Nanostructures: Are We Imaging Atoms?

(2011) Martin Ondráček et al.   PHYSICAL REVIEW LETTERS

Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts

(2011) Markus Ternes et al.   PHYSICAL REVIEW LETTERS

Quantitative Atomic Force Microscopy with Carbon Monoxide Terminated Tips

(2011) Zhixiang Sun et al.   PHYSICAL REVIEW LETTERS

Structure and stability of semiconductor tip apexes for atomic force microscopy

(2009) P Pou et al.   NANOTECHNOLOGY

‘All-inclusive’ imaging of the rutile TiO2(110) surface using NC-AFM

(2009) Ralf Bechstein et al.   NANOTECHNOLOGY

The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

(2009) L. Gross et al.   SCIENCE

Vertical and lateral force mapping on theSi(111)−(7×7)surface by dynamic force microscopy

(2008) Yoshiaki Sugimoto et al.   PHYSICAL REVIEW B