4.6 Article

Identifying passivated dynamic force microscopy tips on H:Si(100)

Journal

APPLIED PHYSICS LETTERS
Volume 100, Issue 23, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4726086

Keywords

-

Funding

  1. Engineering and Physical Sciences Research Council (EPSRC) [EP/G007837/1]
  2. European Commission [270028]
  3. Leverhulme Trust [F00-114/BI]
  4. University of Nottingham High Performance Computing Facility
  5. EPSRC [EP/G007837/1] Funding Source: UKRI
  6. Engineering and Physical Sciences Research Council [EP/G007837/1] Funding Source: researchfish

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The chemical reactivity of the tip plays a central role in image formation in dynamic force microscopy, but in very many cases the state of the probe is a key experimental unknown. We show here that an H-terminated and thus chemically unreactive tip can be readily identified via characteristic imaging and spectroscopic (F(z)) signatures, including, in particular, contrast inversion, on hydrogen-passivated Si(100). We determine the tip apex termination by comparing site-specific difference force curves with the results of density functional theory, providing a clear protocol for the identification of chemically unreactive tips on silicon surfaces. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4726086]

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