Structure and stability of semiconductor tip apexes for atomic force microscopy

Published 2009 View Full Article

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Title
Structure and stability of semiconductor tip apexes for atomic force microscopy
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 20, Issue 26, Pages 264015
Publisher
IOP Publishing
Online
2009-06-11
DOI
10.1088/0957-4484/20/26/264015

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