Inhomogeneous strain in GaN nanowires determined from x-ray diffraction peak profiles
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Title
Inhomogeneous strain in GaN nanowires determined from x-ray diffraction peak profiles
Authors
Keywords
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Journal
PHYSICAL REVIEW B
Volume 86, Issue 11, Pages -
Publisher
American Physical Society (APS)
Online
2012-09-22
DOI
10.1103/physrevb.86.115325
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